Shimadzu’s AIM-9000 Infrared Microscope Rapidly and Non-Destructively IDs Micro-Contaminants

Micro contaminants cause device malfunction in miniaturized devices, such as semiconductors and sensors.

Rapid and non-destructive determination of micro-contaminant chemical ID is the first step in figuring out what went wrong and how to fix it.

Get more information about the AIM-9000 here.

 

This application note from Shimadzu showcases the ability of the AIM-9000 microscope to do just that, providing an analysis of a 10 μm contaminant on the surface of an optical part.

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