Shimadzu’s AIM-9000 Infrared Microscope Rapidly and Non-Destructively IDs Micro-Contaminants

Micro contaminants cause device malfunction in miniaturized devices, such as semiconductors and sensors.

Rapid and non-destructive determination of micro-contaminant chemical ID is the first step in figuring out what went wrong and how to fix it.

Get more information about the AIM-9000 here.


This application note from Shimadzu showcases the ability of the AIM-9000 microscope to do just that, providing an analysis of a 10 μm contaminant on the surface of an optical part.

Leave a Reply

Fill in your details below or click an icon to log in: Logo

You are commenting using your account. Log Out /  Change )

Google photo

You are commenting using your Google account. Log Out /  Change )

Twitter picture

You are commenting using your Twitter account. Log Out /  Change )

Facebook photo

You are commenting using your Facebook account. Log Out /  Change )

Connecting to %s